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Volumn 4, Issue 3, 1993, Pages 199-213

Improving the testability of switched-capacitor filters

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; DESIGN; PERFORMANCE; SWITCHING;

EID: 0027700985     PISSN: 09251030     EISSN: 15731979     Source Type: Journal    
DOI: 10.1007/BF01239074     Document Type: Article
Times cited : (10)

References (19)
  • 4
    • 84936169971 scopus 로고    scopus 로고
    • K.D. Wagner and T.W. Williams, “Design for testability of mixed-signal integrated circuits,”Proc. IEEE 1988 Int. Test Conf., pp. 823-828, 1988.
  • 5
    • 84936212408 scopus 로고    scopus 로고
    • P.P. Fasang, D. Mullins, and T. Wong: “Design for testability for mixed analog/digital ASICs,” in Proc. IEEE 1988 Custom Integrated Circuit Conf., pp. 16.5.1-16.5.4, 1988.
  • 6
    • 84936210578 scopus 로고    scopus 로고
    • M. Soma, “A design-for-test methodology for active analog filters,” in Proc. IEEE Int. Test Conf., pp. 183-192, 1990.
  • 7
    • 84936182733 scopus 로고    scopus 로고
    • C.L. Wey, “Built-in Self-test (BIST) structure for analog circuit fault diagnosis,”IEEE Trans. Instrum. Measure, Vol. 39, 1990.
  • 8
    • 84936183945 scopus 로고    scopus 로고
    • J. Ohletz, “Hybrid built-in self-test (HBIST) for mixed analogue/digital integrated circuits,” in Proc. European Test Conf., pp. 307-316, 1991.
  • 9
    • 84936217243 scopus 로고    scopus 로고
    • G. Schafer, H. Sapotta, and W. Denner, “Block-oriented test strategy for analog circuits,” in Proc. ESSCIRC, pp. 217-220, 1991.
  • 10
    • 84936176594 scopus 로고    scopus 로고
    • D. Vazquez, A. Rueda, and J.L. Huertas,” A practical implementation of fault-tolerant switched-capacitor circuits,” in Proc. IEEE ISCAS, pp. 1565-1568, 1991.
  • 11
    • 84936213226 scopus 로고    scopus 로고
    • J.L. Huertas, D. Vazquez, and A. Rueda, “On-line testing of switched-capacitor filters,” in Proc. IEEE VLSI Test Symp., 1992.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.