Analog circuit observer blocks

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 258-263

  Harjani, Ramesh ^a   Vinnakota, Bapiraju ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT LAYOUT; LINEAR INTEGRATED CIRCUITS; MEASUREMENT ERRORS; OBSERVABILITY;

ANALOG CIRCUIT OBSERVER BLOCK; ON CHIP STRUCTURES;

INTEGRATED CIRCUIT TESTING;

EID: 0028744158     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)