Matching Properties of MOS Transistors

IEEE Journal of Solid-State Circuits

Volumn 24, Issue 5, 1989, Pages 1433-1439

  Pelgrom, Marcel J M ^a   Duinmaijer, Aad C J ^a   Welbers, Anton P G ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; MATHEMATICAL TECHNIQUES--INTEGRAL EQUATIONS; MATHEMATICAL TRANSFORMATIONS--FOURIER TRANSFORMS; SUBSTRATES;

GATE-OXIDE CMOS PROCESS; LONG-DISTANCE MATCHING; MOS TRANSISTORS MATCHING PROPERTIES; MOS TRANSISTORS MISMATCHING; POISSON PROCESS;

SEMICONDUCTOR DEVICES, MOS;

EID: 0024754187     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.1989.572629     Document Type: Article

References (7)

1. M. J. M. Pelgrom, T. Jochijms, and H. Heijns, “A CCD delay line for video applications,” IEEE Trans. Consumer Electron., vol. CE-33, pp. 603–609, 1987.
2. H. Schouwenaars W. Groeneveld, and H. A. H. Termeer, “A stereo 16b CMOS D/A converter for digital audio,” IEEE J. Solid-State Circuits, vol. 23, pp. 1290–1297, 1988.
3. J. B. Shyu, G. C. Temes, and K. Yao, “Random errors in MOS capacitors,” IEEE J. Solid-State Circuits, vol. SC-17, pp. 1070–1075, 1982.
4. J. B. Shyu, G. C. Temes, and F. Krummenacher, “Random errors effects in matched MOS capacitors and current sources,” IEEE J. Solid-State Circuits, vol. SC-19, pp. 948–955, 1984.
5. K. R. Lakshmikumar, R. A. Hadaway, and M. A. Copeland, “Characterization and modeling of mismatch in MOS transistors for precision analog design,” IEEE J. Solid-State Circuits, vol. SC-21, pp. 1057–1066, 1986.
6. W. J. J. Rey, Introduction to Robust and Quasi-Robust Statistical, Methods. Berlin: Springer Verlag, 1983.
7. A. G. F. Dingwall, “Monolithic expandable 6 bit 20 MHz CMOS/SOS A/D converter,” IEEE J. Solid-State Circuits, vol. SC-14, pp. 926–931, 1979.