Comprehensive fault macromodel for opamps

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn , Issue , 1994, Pages 344-348

  Pan, Chen Yang ^a   Cheng, Kwang Ting ^a   Gupta, Sandeep ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FILTERS; COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; ELECTRON DEVICE TESTING; FAILURE ANALYSIS; FOURIER TRANSFORMS; LINEAR INTEGRATED CIRCUITS; POLES AND ZEROS; SHORT CIRCUIT CURRENTS;

ANALOG CIRCUITS; DISCRETE FOURIER TRANSFORMS; FAULT CLASSIFICATION; FAULT COVERAGE; FAULT MACROMODEL; FILTER TESTING; INTERFACING ERROR; SHORT/BRIDGING FAULTS; TRANSISTOR LEVEL FAULTS;

OPERATIONAL AMPLIFIERS;

EID: 0028695095     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)