Concurrent error detection in linear analog and switched-capacitor state variable systems using continuous checksums

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 582-591

  Chatterjee, Abhijit ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG COMPUTERS; CAPACITORS; ERROR DETECTION; MATRIX ALGEBRA;

CONTINUOUS CHECKSUMS; STATE VARIABLE SYSTEMS; SWITCHED CAPACITORS;

ELECTRON DEVICE TESTING;

EID: 0026718074     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)