Built-in self-test and fault diagnosis of fully differential analogue circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn , Issue , 1994, Pages 486-490

  Mir, S ^a   Kolarik, V ^a   Lubaszewski, M ^a   Nielsen, C ^a   Courtois, B ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MONITORING; OPERATIONAL AMPLIFIERS;

BUILT IN SELF TEST; DIFFERENTIAL ANALOGUE CIRCUITS; FAULT DIAGNOSIS; OFFLINE MONITORING;

LINEAR INTEGRATED CIRCUITS;

EID: 0028722347     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)