New strategy for testing analog filters

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 36-41

  Vasquez, D ^a   Rueda, A ^a   Huertas, J L ^a  

^a UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ELECTRIC FAULT LOCATION; ELECTRIC FILTERS; ELECTRIC NETWORK ANALYSIS; ERROR DETECTION; FOURIER TRANSFORMS; MATHEMATICAL MODELS; POLES AND ZEROS; TRANSFER FUNCTIONS;

ANALOG FILTERS; MIXED CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0028742273     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)