Linear error modeling of analog and mixed-signal devices

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 573-581

  Stenbakken, Gerard N ^a   Souders, T Michael ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG COMPUTERS; AUTOMATIC TESTING; MATRIX ALGEBRA; OPTIMIZATION;

LINEAR ERROR MODELS; MIXED SIGNAL DEVICES;

ELECTRON DEVICE TESTING;

EID: 0026618406     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)