Test synthesis for DC test and maximal diagnosis of switched-capacitor circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 252-260

  Dufaza, Christian ^a   Ihs, Hassan ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC NETWORK ANALYSIS; OPERATIONAL AMPLIFIERS; SWITCHING CIRCUITS; TRANSFER FUNCTIONS;

BUILT IN SELF TEST (BIST); SWITCHED CAPACITOR CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0030672596     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)