Using a carbon beam as a probe to extract the thickness of sensitive volumes

IEEE Transactions on Nuclear Science

Volumn 47, Issue 3 PART 1, 2000, Pages 551-558

  Inguimbert, C ^a   Duzellier, S ^a   Ecoffet, R ^a   Guibert, L ^b   Barak, J ^b   Chabot, M ^b  

^a ONERA   (France)

^b CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON BEAM; DECONVOLUTION CALCULATION; EXTRACTION METHOD; SENSITIVE VOLUME; SINGLE ION SPECIE BEAM;

CARBON; CHARGED PARTICLES; CONVOLUTION; DATA REDUCTION; HEAVY IONS; PROTONS;

ION BEAMS;

EID: 0034204840     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.856479     Document Type: Article

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