New approach to the analysis of SEU and SEL data to obtain the sensitive volume thickness

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1995, Pages 321-325

  Barak, J ^a   Levinson, J ^a   Akkerman, A ^a   Hass, M ^a   Victoria, M ^a   Zentner, A ^a   David, D ^a   Even, O ^a   Lifshitz, Y ^a  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC SURGES; ELECTROSTATIC ACCELERATORS; ENERGY TRANSFER; IONS; PROTONS; RANDOM ACCESS STORAGE; SEMICONDUCTING SILICON; SENSITIVITY ANALYSIS;

KOFFLER ACCELERATOR; LINEAR ENERGY TRANSFER; SINGLE EVENT LATCHUP; SINGLE EVENT UPSET;

RADIATION EFFECTS;

EID: 0029455072     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)