Study of single-event-upsets in PAL16R8

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1993, Pages 33-35

  Barak, J ^a   Levinson, J ^a   Zentner, A ^a   David, D ^a   Even, O ^a   Hass, M ^a,b   Ilberg, D ^a   Lifshitz, Y ^a  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION HARDENING; TRANSIENTS;

DIFFERENT OPERATING CONDITIONS; ION RANGES; SEU CROSS-SECTION; SINGLE EVENT UPSETS;

RADIATION EFFECTS;

EID: 33747797456     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1993.700565     Document Type: Conference Paper

References (8)

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8. J. A. Zoutendyk, H. R. Schwartz, and L. R. Nevill, "Lateral Charge Transport from Heavy-Ion Tracks in Integrated Circuit Chips", IEEE Trans, nucl. Sci. NS-35, pp. 1644-1647 (1988).