Proton induced spallation reactions

Radiation Physics and Chemistry

Volumn 43, Issue 1-2, 1994, Pages 139-149

  McNulty, Peter J ^a   Abdel Kader, Wagih G ^a   Farrell, Gary E ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CONTROLLED STUDY; ELECTRONICS; PROTON RADIATION; RADIATION PHYSICS; SPACE FLIGHT;

COMPUTER SIMULATION; DIGITAL COMPUTERS; KINEMATICS; PROTONS; RADIATION EFFECTS; SATELLITES;

PROTON INDUCED SPALLATION;

ELECTRONIC EQUIPMENT;

EID: 0028182185     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0969-806X(94)90207-0     Document Type: Article

References (15)

1. A verified proton induced latch-up in space (CMOS SRAM)
2. Comparison of Soft Errors Induced by Heavy Ions and Protons
3. SEU flight data from the CRRES MEP
4. Radiation environment measurements and single event upset observations in Sun synchronous orbit
5. The on-orbit measurements of single event phenomena by the ETS-V spacecraft
6. Predicting SEU phenomena in space
7. Modeling charge collection and single event upsets in microelectronics
8. Proton-Induced Nuclear Reactions in Silicon
9. Comparison of the charge collecting properties of junctions and the SEU response of microelectronic circuits
10. Test of SEU algorithms against preliminary CRRES statellite data
11. The measurement and prediction of proton upsets