SINGLE-EVENT UPSET (SEU) MODEL VERIFICATION AND THRESHOLD DETERMINATION USING HEAVY IONS IN A BIPOLAR STATIC RAM.

IEEE Transactions on Nuclear Science

Volumn NS-32, Issue 6, 1985, Pages

  Zoutendyk, J A ^a   Smith, L S ^a   Soli, G A ^a   Thieberger, P ^a   Wegner, H E ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA STORAGE, DIGITAL - RANDOM ACCESS;

HEAVY IONS; SINGLE EVENT UPSET;

INTEGRATED CIRCUITS;

EID: 0022215258     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)