Low LET cross-section measurements using high energy carbon beam

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2230-2236

  Ecoffet, R ^a   Duzellier, S ^b   Falguere D ^a,b   Guibert, L ^b   Inguimbert, C ^a,b  

^a CNES   (France)

^b ONERA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; ELECTRONIC EQUIPMENT TESTING; ENERGY TRANSFER; ION BEAMS;

DYNAMIC RANDOM ACCESS MEMORY (DRAM); LINEAR ENERGY TRANSFER (LET); STATIC RANDOM ACCESS MEMORY (SRAM);

RANDOM ACCESS STORAGE;

EID: 0031337409     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659040     Document Type: Article

References (13)

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