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Volumn 42, Issue 6, 1995, Pages 2026-2034

Further Development of the Heavy ion Cross Section for Single Event Upset: Model (HICUP)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; IONS; MATHEMATICAL MODELS; RADIATION EFFECTS;

EID: 0029521841     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.489249     Document Type: Article
Times cited : (48)

References (13)
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  • 4
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    • Rate Predictions for Single Event Effects–A Critique
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    • E. L. Petersen, J. C. Pickel, J. H. Adams, Jr., and E. C. Smith, “Rate Predictions for Single Event Effects–A Critique,” IEEE Trans. Nuc. Sci., vol. NS-39, no. 6, pp. 1577–1599, Dec. 1992.
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    • Petersen, E.L.1    Pickel, J.C.2    Adams, J.H.3    Smith, E.C.4
  • 5
    • 0027810885 scopus 로고
    • Effects of Process Parameter Distributions and Ion Strike Locations on SEU Cross-Section Data
    • Dec.
    • L. W. Massengill, M. L. Ales, S.E.Kerns, and K. Jones, “Effects of Process Parameter Distributions and Ion Strike Locations on SEU Cross-Section Data,” IEEE Trans. Nuc. Sci., vol. NS-40, no. 6, pp. 1804–1811, Dec. 1993.
    • (1993) IEEE Trans. Nuc. Sci. , vol.NS-40 , Issue.6 , pp. 1804-1811
    • Massengill, L.W.1    Ales, M.L.2    Kerns, S.E.3    Jones, K.4
  • 7
    • 0027853304 scopus 로고
    • The Shape of Heavy Ion Upset Cross Section Curves
    • Dec.
    • M. A. Xapsos, T. R. Weatherford, and P. Shapiro, “The Shape of Heavy Ion Upset Cross Section Curves,” IEEE Trans. Nuc Sci., vol. NS-40, no. 6, pp. 1812–1819, Dec. 1993.
    • (1993) IEEE Trans. Nuc Sci. , vol.NS-40 , Issue.6 , pp. 1812-1819
    • Xapsos, M.A.1    Weatherford, T.R.2    Shapiro, P.3
  • 8
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    • Determination of SEU Parameters of NMOS and CMOS SRAMs
    • Dec.
    • P. J. McNulty, W. J. Beauvais, and D. R. Roth, Determination of SEU Parameters of NMOS and CMOS SRAMs,” IEEE Trans. Nuc. Sci., vol. NS-38, no. 6, pp. 1463–1470, Dec. 1991.
    • (1991) IEEE Trans. Nuc. Sci. , vol.NS-38 , Issue.6 , pp. 1463-1470
    • McNulty, P.J.1    Beauvais, W.J.2    Roth, D.R.3
  • 9
    • 0024902710 scopus 로고
    • SEU Characterization of a Hardened CMOS 64K and 256K SRAM
    • Dec.
    • F. W. Sexton, J. S. Fu, R. A. Kohler, and R. Koga, “SEU Characterization of a Hardened CMOS 64K and 256K SRAM,” IEEE Trans. Nuc. Sci., vol. NS-36, no. 6, pp. 2311–2317, Dec. 1989.
    • (1989) IEEE Trans. Nuc. Sci. , vol.NS-36 , Issue.6 , pp. 2311-2317
    • Sexton, F.W.1    Fu, J.S.2    Kohler, R.A.3    Koga, R.4
  • 10
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    • private communication
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  • 11
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    • Determination of Funnel Length from Heavy Ion Cross Section versus LET Measurements
    • Dec.
    • K. W. Golke, “Determination of Funnel Length from Heavy Ion Cross Section versus LET Measurements,” IEEE Trans. Nuc. Sci., vol. NS-40, no. 6, pp. 1910–1917, Dec. 1993.
    • (1993) IEEE Trans. Nuc. Sci. , vol.NS-40 , Issue.6 , pp. 1910-1917
    • Golke, K.W.1
  • 13
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    • Variations in SEU Sensitivity of Dose-Imprinted CMOS SRAMs
    • Dec.
    • E.G. Stassinopoulos, G.J. Brucker, O. Van Gunten, and H.S. Kim, “Variations in SEU Sensitivity of Dose-Imprinted CMOS SRAMs,” IEEE Trans. Nucl. Sci., vol. 36, no. 6 pp. 2330–2338 Dec. 1989.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.