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Volumn 4, Issue 1, 1998, Pages 29-34

Niobium Oxide Thin Films Grown by Atomic Layer Epitaxy

Author keywords

Atomic layer epitaxy; Dielectrics; Niobium; Niobium oxide; Thin films

Indexed keywords

EPITAXIAL GROWTH; FILM GROWTH; NIOBIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; THIN FILMS; WATER;

EID: 0031701182     PISSN: 09481907     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1521-3862(199801)04:01<29::aid-cvde29>3.3.co;2-i     Document Type: Article
Times cited : (78)

References (51)
  • 21
    • 0347132857 scopus 로고    scopus 로고
    • See articles in Catal. Today 1996, 28, Nos. 1-2.
    • (1996) Catal. Today , vol.28 , pp. 1-2
  • 24
    • 0041522332 scopus 로고
    • T. Suntola, Mater. Sci. Rep. 1989, 7, 266. T. Suntola, Thin Solid Films 1992, 216, 84.
    • (1989) Mater. Sci. Rep. , vol.7 , pp. 266
    • Suntola, T.1
  • 25
    • 0002572435 scopus 로고
    • T. Suntola, Mater. Sci. Rep. 1989, 7, 266. T. Suntola, Thin Solid Films 1992, 216, 84.
    • (1992) Thin Solid Films , vol.216 , pp. 84
    • Suntola, T.1
  • 43
    • 0347132853 scopus 로고    scopus 로고
    • Joint Committee of Powder Diffraction Data, Card 27-1312
    • Joint Committee of Powder Diffraction Data, Card 27-1312.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.