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Volumn 120, Issue 1-2, 1997, Pages 43-50

AFM studies on ZnS thin films grown by atomic layer epitaxy

(7) Ihanus, Jarkko a Ritala, Mikko a Leskelä, Markku a Prohaska, Thomas b Resch, Roland b Friedbacher, Gernot b Grasserbauer, Manfred b

a UNIVERSITY OF HELSINKI (Finland)

b VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

Author keywords

AFM; ALE; Glass; Mica; Thin film; ZnS

Indexed keywords

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; GLASS; MICA; MOLECULAR ORIENTATION; MORPHOLOGY; NUCLEATION; POLYCRYSTALLINE MATERIALS; THIN FILMS; X RAY DIFFRACTION; ZINC SULFIDE;

ATOMIC LAYER EPITAXY; NUCLEATION DENSITY; ZINC CHLORIDE;

SEMICONDUCTOR GROWTH;

EID: 0031269624 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(97)00226-2 Document Type: Article

Times cited : (86)

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