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Volumn 68, Issue 26, 1996, Pages 3737-3739

Tailoring the dielectric properties of HfO2-Ta2O5 nanolaminates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0348067304     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115990     Document Type: Article
Times cited : (211)

References (17)
  • 9
    • 21544484447 scopus 로고    scopus 로고
    • T. Suntola, in Handbook of Crystal Growth 3, Thin Films and Epitaxy, Part B: Growth Mechanics and Dynamics, edited by D. T. J. Hurle (Elsevier, Amsterdam, 1994), p. 601
    • T. Suntola, in Handbook of Crystal Growth 3, Thin Films and Epitaxy, Part B: Growth Mechanics and Dynamics, edited by D. T. J. Hurle (Elsevier, Amsterdam, 1994), p. 601.
  • 12
    • 21544448968 scopus 로고    scopus 로고
    • D. Gerstenberg, in Handbook of Thin Film Technology, Thin Film Capacitors, edited by L. I. Maissel and R. Glang (McGraw-Hill, New York, 1970), p. 19-8
    • D. Gerstenberg, in Handbook of Thin Film Technology, Thin Film Capacitors, edited by L. I. Maissel and R. Glang (McGraw-Hill, New York, 1970), p. 19-8.
  • 15
    • 21544450114 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards, Cards 6-318 and 8-342
    • Joint Committee on Powder Diffraction Standards, Cards 6-318 and 8-342.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.