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Volumn 286, Issue 1-2, 1996, Pages 54-58

Studies on the morphology of Al2O3 thin films grown by atomic layer epitaxy

Author keywords

Aluminium oxide; Atomic force microscopy; Epitaxy; Surface morphology

Indexed keywords

AGGLOMERATION; ALUMINA; ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; MORPHOLOGY; SURFACES;

EID: 0030233425     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(95)08524-6     Document Type: Article
Times cited : (58)

References (21)
  • 1
    • 0004266127 scopus 로고
    • T. Suntola and M. Simpson (eds.), Blackie and Son Ltd., Glasgow
    • M. Leskelä and L. Niinistö, in T. Suntola and M. Simpson (eds.), Atomic Layer Epitaxy, Blackie and Son Ltd., Glasgow, 1990, p. 1.
    • (1990) Atomic Layer Epitaxy , pp. 1
    • Leskelä, M.1    Niinistö, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.