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Volumn 286, Issue 1-2, 1996, Pages 54-58
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Studies on the morphology of Al2O3 thin films grown by atomic layer epitaxy
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Author keywords
Aluminium oxide; Atomic force microscopy; Epitaxy; Surface morphology
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Indexed keywords
AGGLOMERATION;
ALUMINA;
ATOMIC FORCE MICROSCOPY;
EPITAXIAL GROWTH;
MORPHOLOGY;
SURFACES;
ATOMIC LAYER EPITAXY;
POLYCRYSTALLINE FILMS;
ROOT-MEAN-SQUARE ROUGHNESS;
THIN FILMS;
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EID: 0030233425
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(95)08524-6 Document Type: Article |
Times cited : (58)
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References (21)
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