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Volumn 80, Issue 2, 1997, Pages 336-342

Use of ferroelectric hysteresis parameters for evaluation of niobium effects in lead zirconate titanate thin films

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FORCE; FERROELECTRICITY; GRAIN SIZE AND SHAPE; HYSTERESIS; MICROSTRUCTURE; NIOBIUM; POLARIZATION; REMANENCE; SOL-GELS; SURFACES; TEXTURES; THIN FILMS;

EID: 0031078613     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb02835.x     Document Type: Review
Times cited : (47)

References (23)
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  • 6
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    • Structural Characterization of Nb Doped Lead Zirconate Titanate Ferroelectric Thin Films
    • Institute of Physics Conference Series No. 117: Section 6, Oxford, U.K., March 25-28
    • L. Weaver, L. D. Madsen, and E. M. Griswold, "Structural Characterization of Nb Doped Lead Zirconate Titanate Ferroelectric Thin Films"; in Institute of Physics Conference Series No. 117: Section 6, Microscopy of Semiconductor Materials Conference, Oxford, U.K., March 25-28, 1991).
    • (1991) Microscopy of Semiconductor Materials Conference
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  • 7
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    • The Influence of Nb Doping on Lead Zirconate Titanate Ferroelectric Thin Films
    • E. M. Griswold, M. Sayer, D. T. Amm, and I. D. Calder, "The Influence of Nb Doping on Lead Zirconate Titanate Ferroelectric Thin Films," Can. J. Phys., 69, 260-64 (1991).
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  • 9
    • 0026931746 scopus 로고
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    • 3 Thin Films for Ferroelectric Memory Applications," J. Electron. Mater., 21, 971-75 (1992).
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    • IEEE Catalog No. 92CH3080-9. Institute of Electrical and Electronic Engineers, Piscataway, NJ
    • J. Chen, M. P. Harmer, and D. M. Smyth, "Polarization Fatigue in Perovskite Ferroelectric Ceramics and Thin Films"; pp. 111-15 in IEEE 8th International Symposium on Applications of Ferroelectrics, IEEE Catalog No. 92CH3080-9. Institute of Electrical and Electronic Engineers, Piscataway, NJ, 1992.
    • (1992) IEEE 8th International Symposium on Applications of Ferroelectrics , pp. 111-115
    • Chen, J.1    Harmer, M.P.2    Smyth, D.M.3
  • 16
    • 0028416950 scopus 로고
    • Effects of Dopants in PZT Films
    • J.-F. Chang and S. B. Desu, "Effects of Dopants in PZT Films," J. Mater. Res., 9, 955-69 (1994).
    • (1994) J. Mater. Res. , vol.9 , pp. 955-969
    • Chang, J.-F.1    Desu, S.B.2
  • 18
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    • Orientation of Rapid Thermally Annealed Lead Zirconate Titanate Thin Films on (111) Pt Substrates
    • K. G. Brooks, I. M. Reaney, R. Klissurska, Y. Huang, L. Bursill, and N. Setter, "Orientation of Rapid Thermally Annealed Lead Zirconate Titanate Thin Films on (111) Pt Substrates," J. Mater. Res., 9, 2540-53 (1994).
    • (1994) J. Mater. Res. , vol.9 , pp. 2540-2553
    • Brooks, K.G.1    Reaney, I.M.2    Klissurska, R.3    Huang, Y.4    Bursill, L.5    Setter, N.6
  • 19
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    • Crystallization of Sol-Gel Derived Lead Zirconate Titanate Thin Films in Argon and Oxygen Atmospheres
    • L. A. Bursill and K. G. Brooks, "Crystallization of Sol-Gel Derived Lead Zirconate Titanate Thin Films in Argon and Oxygen Atmospheres," J. Appl. Phys., 75, 4501-509 (1994).
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    • Bursill, L.A.1    Brooks, K.G.2
  • 20
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    • Investigation of Pt/Ti Bilayer Metallization on Silicon for Ferroelectric Thin Film Integration
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  • 21
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    • Edited by O. Auciello and R. Waser. Kluwer, Dordrecht, The Netherlands
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  • 22
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    • Tagantsev, A.K.1    Landivar, M.2    Colla, E.3    Setter, N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.