Proposal of a Schottky-Barrier SET Aiming at a Future Integrated Device

IEICE Transactions on Electronics

Volumn E80-C, Issue 7, 1997, Pages 881-885

  Fujishima, Minoru ^a   Fukui, Hironobu ^a   Amakawa, Shuhei ^a   Hoh, Koichiro ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Coulomb blockade; Short channel device; Single electron

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; LEAKAGE CURRENTS; TRANSISTORS; TUNNEL JUNCTIONS;

COULOMB BLOCKADE; SINGLE ELECTRON TRANSISTOR (SET);

SCHOTTKY BARRIER DIODES;

EID: 0031192154     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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