Static secondary ion mass spectrometry: (S-SIMS) part 1. Methodology and structural interpretation

Mass Spectrometry Reviews

Volumn 18, Issue 1, 1999, Pages 1-47

  Van Vaeck, Luc ^a   Adriaens, Annemie ^a   Gijbels, Renaat ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009813642     PISSN: 02777037     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1098-2787(1999)18:1<1::AID-MAS1>3.0.CO;2-W     Document Type: Article

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