Surface segregation in poly(styrene-b-isoprene): Correlation of TOF-SIMS with XPS and contact angle measurements

American Chemical Society, Polymer Preprints, Division of Polymer Chemistry

Volumn 37, Issue 1, 1996, Pages 309-310

  Nicholas, M ^a,d   Kassis, C M ^a   Menceloglu, Y Z ^a,d   DeSimone, J M ^a   Linton, R W ^a   Friedman, Robert Mark ^b   Parker, D L ^b   Rading, D ^c   Benninghoven, A ^c  

^a University of North Carolina at Chapel Hill   (United States)

^b MONSANTO COMPANY   (United States)

^c UNIVERSITY OF MÜNSTER   (Germany)

^d Fabrikatan Cad Tasacagi ^*  (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE; POLYISOPRENES; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE SEGREGATION; TIME OF FLIGHT (TOF) MEASUREMENTS;

BLOCK COPOLYMERS;

EID: 3242827574     PISSN: 00323934     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)

1. Brewis, D. M.; Briggs, D. Industrial Adhesion Problems; John Wiley & Sons, Inc.: New York, 1985
2. Feld, H.; Leute, A.; Zurmuehlen, R.; and Benninghoven, A. Anal. Chem. (1991), 63, 903
3. Matlab from The Math Works, Inc., 24 Prime Park Way, Natick, MA, 01760
4. PLS_Toolbox (for use with Matlab; see Ref. [3]) from Eigenvector Technologies, 4154 Laurel Drive, West Richland, WA 99352
5. D. L Parker and R. M. Friedman, in preparation.
6. Wu, S. in Polymer Handbook, 3rd Ed.; Brandup, J. and Immergut, E. H., Eds.; John Wiley & Sons, Inc.: New York, 1989, p VI-415
7. Wu, S. in Polymer Handbook, 3rd Ed.; Brandup, J. and Immergut, E. H., Eds.; John Wiley & Sons, Inc.: New York, 1989, p VI-41
8. Beamson, G.; Briggs, D. High Resolution XPS of Organic Polymers: the Scienta ESCA300 Database; John Wiley & Sons, Inc.: Chichester, 1992, pp 68-73