Secondary ion emission from Langmuir-Blodgett (LB) films investigated by time-of-flight secondary ion mass spectrometry

Applied Surface Science

Volumn 100-101, Issue , 1996, Pages 129-133

  Kudo, M ^a   Yamada, S ^a   Yoshida, S ^b   Watanabe, T ^b   Hoshi, T ^c  

^a SEIKEI UNIVERSITY   (Japan)

^b INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^c ULVAC PHI Inc   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; ENERGY DISSIPATION; INTERFACES (MATERIALS); ION BEAMS; MONOLAYERS; SECONDARY ION MASS SPECTROMETRY; SILICON;

CADMIUM ARACHIDATE; INTENSITY VARIATIONS; SECONDARY ION EMISSIONS; SECONDARY ION SPECIES; STATIC SECONDARY ION MASS SPECTROMETRY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

LANGMUIR BLODGETT FILMS;

EID: 0030564418     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(96)00272-3     Document Type: Article

References (8)

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