Time-of-flight-secondary ion mass spectrometry of NaBF4: A comparison of atomic and polyatomic primary ions at constant impact energy

Rapid Communications in Mass Spectrometry

Volumn 11, Issue 16, 1997, Pages 1794-1798

  Van Stipdonk, M J ^a,b   Harris, R D ^a   Schweikert, E A ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

^b Ionwerks   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; FLUORINE COMPOUNDS; ION BOMBARDMENT; IONS; PROJECTILES; SECONDARY ION MASS SPECTROMETRY;

ATOMIC SPECIES; CS +; IMPACT ENERGY; POLYATOMIC ION; POLYATOMIC PRIMARY IONS; PRIMARY IONS; SINGLE-ION IMPACTS; TETRAFLUOROBORATES; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

SODIUM COMPOUNDS;

EID: 0030690145     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19971030)11:16<1794::AID-RCM79>3.0.CO;2-L     Document Type: Article

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