Surface characterization of EMA copolymers using XPS and ToF-SIMS

Surface and Interface Analysis

Volumn 24, Issue 6, 1996, Pages 380-388

  Galuska, Alan ^a  

^a EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACRYLICS; CHARACTERIZATION; COMPOSITION; COPOLYMERS; ETHYLENE; MELTING; SECONDARY ION MASS SPECTROMETRY; SURFACE PROPERTIES; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPLETED PHASE; METHYL ACRYLATE; QUANTIFICATION; SEGREGATION EFFECTS; SURFACE CHEMISTRY;

SURFACES;

EID: 0030170512     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199606)24:6<380::AID-SIA128>3.0.CO;2-3     Document Type: Article

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