Detection Limit and Surface Coverage Determination for Tributyl Phosphate on Soils by Static SIMS

Analytical Chemistry

Volumn 68, Issue 8, 1996, Pages 1309-1316

  Ingram, J C ^a   Groenewold, G S ^a   Appelhans, A D ^a   Dahl, D A ^a   Delmore, J E ^a  

^a IDAHO NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MONOLAYERS; PHOSPHATES; SECONDARY ION MASS SPECTROMETRY; SOIL POLLUTION; SOILS; SURFACES;

ION TRAP MASS ANALYZERS; MINIMUM DETECTABLE LIMITS; QUADRUPOLE MASS ANALYZERS; STATIC SIMS; SUBMONOLAYER COVERAGE; SURFACE CONCENTRATION; SURFACE COVERAGE; TRIBUTYL PHOSPHATES;

ORGANIC COMPOUNDS;

EID: 0030121852     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac9505841     Document Type: Article

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