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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 131, Issue 1-4, 1997, Pages 38-54

TOF-SIMS analysis of polymers

(1) Wien, Karl a

a DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DESORPTION; ION BOMBARDMENT; ION SOURCES; MOLECULAR WEIGHT; RADIATION EFFECTS; SECONDARY ION MASS SPECTROMETRY;

TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF SIMS);

POLYMERS;

EID: 0031549192 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(97)00147-X Document Type: Article

Times cited : (44)

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