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Volumn 11, Issue 2, 1997, Pages 179-183
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A comparison of the techniques of secondary ion mass spectrometry and resonance ionization mass spectrometry for the analysis of potentially toxic element accumulation in neural tissue
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ARGON LASERS;
DYE LASERS;
IONIZATION;
MASS SPECTROMETERS;
SECONDARY EMISSION;
TISSUE;
CORTICAL TISSUES;
DETECTION LIMITS;
NEURAL TISSUE;
NEURO-TOXIC ELEMENTS;
POTENTIALLY TOXIC ELEMENTS;
REFLECTRONS;
RESONANCE IONIZATION MASS SPECTROMETRY;
SECONDARY ION-MASS SPECTROMETRY;
TARGET SPUTTERING;
TIME-OF-FLIGHT MASS SPECTROMETERS;
SECONDARY ION MASS SPECTROMETRY;
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EID: 0030960873
PISSN: 09514198
EISSN: None
Source Type: Journal
DOI: 10.1002/(sici)1097-0231(19970131)11:2<179::aid-rcm757>3.0.co;2-%23 Document Type: Article |
Times cited : (6)
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References (10)
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