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Volumn 11, Issue 2, 1997, Pages 179-183

A comparison of the techniques of secondary ion mass spectrometry and resonance ionization mass spectrometry for the analysis of potentially toxic element accumulation in neural tissue

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ARGON LASERS; DYE LASERS; IONIZATION; MASS SPECTROMETERS; SECONDARY EMISSION; TISSUE;

EID: 0030960873     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-0231(19970131)11:2<179::aid-rcm757>3.0.co;2-%23     Document Type: Article
Times cited : (6)

References (10)
  • 5
    • 85153542552 scopus 로고
    • Ph.D. Thesis, University of Wales Swansea
    • O. R. Jones, Ph.D. Thesis, University of Wales Swansea (1995).
    • (1995)
    • Jones, O.R.1
  • 8
    • 85153539520 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Wales Swansea
    • R. M. Perks, Ph.D. Thesis, University of Wales Swansea (1996).
    • (1996)
    • Perks, R.M.1
  • 10
    • 85153545050 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Wales Swansea
    • C. J. Abraham, Ph.D. Thesis, University of Wales Swansea (1997).
    • (1997)
    • Abraham, C.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.