Tem-based phase retrieval of p–n junction wafers using the transport of intensity equation

Philosophical Magazine

Volumn 87, Issue 24, 2007, Pages 3565-3578

  Petersen, T C ^a   Keast, V J ^b   Johnson, K ^c   Duvall, S ^d  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITY OF NEWCASTLE   (Australia)

^c INTEL CORPORATION   (United States)

^d Intel Australia Pty Ltd   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85008832164     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701361388     Document Type: Article

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