Influence of charged oxide layers on TEM imaging of reverse-biased (formula presented) junctions

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 4, 2003, Pages

  Beleggia, M ^a   Fazzini, P F ^a   Pozzi, G ^a   Merli, P G ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85038942727     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.045328     Document Type: Article

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