Electron microscopy of reverse biased p-n junctions

Micron

Volumn 31, Issue 3, 2000, Pages 231-236

  Beleggia, M ^a   Cristofori, D ^a,b   Merli, P G ^b   Pozzi, G ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b CNR   (Italy)

Author keywords

Electron microscopy; Fresnel diffraction; Lorentz microscopy; P n junctions

Indexed keywords

EID: 0034088942     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00088-8     Document Type: Conference Paper

References (10)

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