메뉴 건너뛰기




Volumn 16, Issue 7, 2016, Pages 4417-4423

Real-space mapping of surface trap states in CIGSe nanocrystals using 4D electron microscopy

Author keywords

4D scanning ultrafast electron microscopy; charge carrier dynamics; CIGSe; semiconductor nanocrystals; shelling; surface traps

Indexed keywords

CARRIER LIFETIME; CHARGE CARRIERS; COPPER; DYNAMICS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; INDIUM; LASER SPECTROSCOPY; LAYERED SEMICONDUCTORS; MAPPING; NANOCRYSTALS; PASSIVATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM; SEMICONDUCTOR DEVICES; SURFACE STATES; ZINC SULFIDE;

EID: 84978776332     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/acs.nanolett.6b01553     Document Type: Article
Times cited : (24)

References (74)
  • 3
    • 41549138285 scopus 로고    scopus 로고
    • Banin, U. Nat. Photonics 2008, 2, 209-210 10.1038/nphoton.2008.40
    • (2008) Nat. Photonics , vol.2 , pp. 209-210
    • Banin, U.1
  • 34
    • 0033576670 scopus 로고    scopus 로고
    • Cao, Y.-W.; Banin, U. Angew. Chem., Int. Ed. 1999, 38, 3692-3694 10.1002/(SICI)1521-3773(19991216)38:24<3692::AID-ANIE3692>3.0.CO;2-W
    • (1999) Angew. Chem., Int. Ed. , vol.38 , pp. 3692-3694
    • Cao, Y.-W.1    Banin, U.2
  • 36
  • 51
    • 77950802384 scopus 로고    scopus 로고
    • Zewail, A. H. Science 2010, 328, 187-193 10.1126/science.1166135
    • (2010) Science , vol.328 , pp. 187-193
    • Zewail, A.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.