Nanoscale mechanical drumming visualized by 4D electron microscopy

Nano Letters

Volumn 8, Issue 11, 2008, Pages 3557-3562

  Kwon, Oh Hoon ^a   Barwick, Brett ^a   Park, Hyun Soon ^a   Baskin, J Spencer ^a   Zewail, Ahmed H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FUNDAMENTAL FREQUENCIES; GRAPHITE FILMS; IN-PLANE STRESS; IN-SITU; MATERIALS STRUCTURES; MECHANICAL MOTIONS; MICRON-SCALE; MODE-LOCKING; NANO-SCALE; NANO-SCALE MATERIALS; QUALITY FACTORS; STRESS PULSE; TIME DIMENSIONS; YOUNG'S MODULUS;

GRAPHITE; RESONANCE; SINGLE CRYSTALS;

NANOSTRUCTURED MATERIALS;

NANOMATERIAL;

ARTICLE; ELECTRON MICROSCOPY; FOURIER ANALYSIS; IMAGE PROCESSING; TIME; ULTRASTRUCTURE;

FOURIER ANALYSIS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON; NANOSTRUCTURES; TIME FACTORS;

EID: 56749136897     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl8029866     Document Type: Article

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