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Volumn 87, Issue 8, 2013, Pages

Challenge to the deep-trap model of the surface in semiconductor nanocrystals

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EID: 84874519482     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.081201     Document Type: Article
Times cited : (137)

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