BIST-based delay-fault testing in FPGAs

Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002

Volumn , Issue , 2002, Pages 131-134

  Abramovici, M ^a   Stroud, C ^b  

^a AGERE SYSTEMS   (United States)

^b University of North Carolina at Charlotte   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST;

DELAY-FAULT TESTING; ON-LINE TESTING;

RECONFIGURABLE HARDWARE;

EID: 84962651712     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2002.1030195     Document Type: Conference Paper

References (18)

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