Comparison of Schottky contacts on β-gallium oxide thin films and bulk crystals

Applied Physics Express

Volumn 8, Issue 12, 2015, Pages

  Muller, Stefan ^a   Von Wenckstern, Holger ^a   Schmidt, Florian ^a   Splith, Daniel ^a   Schein, Friedrich Leonhard ^a   Frenzel, Heiko ^a   Grundmann, Marius ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM COMPOUNDS; OXIDE FILMS; PLATINUM COMPOUNDS; SEMICONDUCTOR DOPING; SINGLE CRYSTALS;

BANDBENDING; BARRIER HEIGHTS; BULK CRYSTALS; BULK SINGLE CRYSTALS; CURRENT VOLTAGE MEASUREMENT; DOPING DENSITIES; GALLIUM OXIDES; SCHOTTKY CONTACTS;

THIN FILMS;

EID: 84948823580     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.7567/APEX.8.121102     Document Type: Article

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