Band bending and surface defects in β-Ga 2O 3

Applied Physics Letters

Volumn 100, Issue 18, 2012, Pages

  Lovejoy, T C ^a,b,e   Chen, Renyu ^b,c   Zheng, X ^b,c   Villora, E G ^d   Shimamura, K ^d   Yoshikawa, H ^d   Yamashita, Y ^d   Ueda, S ^d   Kobayashi, K ^d   Dunham, S T ^b,c   Ohuchi, F S ^b,c   Olmstead, M A ^a,b  

^a UNIVERSITY OF WASHINGTON   (United States)

^b Center for Nanotechnology (UW)   (United States)

^c Box 352500 ^*  (United States)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^e Nion Co Kirkland   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDBENDING; CONDUCTING OXIDES; FLAT BAND; HARD X-RAY PHOTOEMISSION SPECTROSCOPY; LARGE BAND; NEGATIVELY CHARGED SURFACES; SURFACE BAND BENDING;

DENSITY FUNCTIONAL THEORY; OHMIC CONTACTS; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY;

GALLIUM;

EID: 84862538787     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4711014     Document Type: Article

References (18)

1. N. Ueda, H. Hosono, R. Waseda, and H. Kawazoe, Appl. Phys. Lett. 70, 3561 (1997). 10.1063/1.119233
2. L. Binet and D. Gourier, J. Phys. Chem. Solids 59, 1241 (1998). 10.1016/S0022-3697(98)00047-X
3. G. J. Exharos and X.-D. Zhou, Thin Solid Films 515, 7025 (2007). 10.1016/j.tsf.2007.03.014
4. E. G. Víllora, K. Shimamura, Y. Yoshikawa, T. Ujiie, and K. Aoki, Appl. Phys. Lett. 92, 202120 (2008). 10.1063/1.2919728
5. J. B. Varley, J. R. Weber, A. Janotti, and C. G. van de Walle, Appl. Phys. Lett. 97, 142106 (2010). 10.1063/1.3499306
6. M. Bartic, C.-I. Baban, H. Suzuki, M. Ogita, and M. Isai, J. Am. Ceram. Soc. 90, 2879 (2007) 10.1111/j.1551-2916.2007.01842.x.
7. P. Y. Yu and M. Cardona, Fundamental of Semiconductors: Physics and Materials Properties (Springer, New York, 1996).
8. T. C. Lovejoy, E. N. Yitamben, N. Shamir, J. Morales, E. G. Villora, K. Shimamura, S. Zheng, F. S. Ohuchi, and M. A. Olmstead, Appl. Phys. Lett. 94, 081906 (2009). 10.1063/1.3086392
9. G. Kresse and J. Furthmuller, Comput. Mater. Sci. 6, 15 (1996). 10.1016/0927-0256(96)00008-0
10. J. P. Perdew, J. A. Chevary, S. H. Vosko, K. A. Jackson, M. R. Pederson, D. J. Singh, and C. Fiolhais, Phys. Rev. B 46, 6671 (1992). 10.1103/PhysRevB.46. 6671
11. D. Vanderbilt, Phys. Rev. B 41, 7892 (1990). 10.1103/PhysRevB.41.7892
12. K. Kobayashi, Nucl. Instrum. Methods Phys. Res. A 601, 32 (2009). 10.1016/j.nima.2008.12.188
13. L. Kronik and Y. Shapira, Surf. Sci. Rep. 37, 1 (1999). 10.1016/S0167-5729(99)00002-3
14. C. G. Van de Walle and J. Neugebauer, J. Appl. Phys. 95, 3851 (2004). 10.1063/1.1682673
15. V. M. Bermudez, Chem. Phys. 323, 193 (2006). 10.1016/j.chemphys.2005.08. 051
16. K. Shimamura, E. G. Víllora, T. Ujiie, and K. Aoki, Appl. Phys. Lett. 92, 201914 (2008). 10.1063/1.2910768
17. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy: Methods and Applications (Cambridge University Press, New York, 1994).
18. T. C. Lovejoy, Ph.D. dissertation, Department of Physics, University of Washington, 2010.