Thermal transport across atomic-layer material interfaces

Nanotechnology Reviews

Volumn 4, Issue 6, 2015, Pages 533-555

  Yue, Yanan ^a   Zhang, Jingchao ^b   Tang, Xiaoduan ^c   Xu, Shen ^d   Wang, Xinwei ^d  

^a WUHAN UNIVERSITY   (China)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^c Thrustmaster of Texas   (United States)

^d Iowa State University   (United States)

Author keywords

2D atomic layer; graphene; interface; Raman spectroscopy; thermal resistance

Indexed keywords

ATOMS; CHARACTERIZATION; GRAPHENE; HEAT RESISTANCE; INTERFACES (MATERIALS); LAYERED SEMICONDUCTORS; MOLECULAR DYNAMICS; MOLYBDENUM COMPOUNDS; RAMAN SPECTROSCOPY; SUBSTRATES;

ATOMIC LAYER; ATOMIC-SCALE SIMULATIONS; CHARACTERIZATION TECHNIQUES; EXPERIMENTAL CHARACTERIZATION; EXPERIMENTAL TECHNIQUES; LARGE-SCALE APPLICATIONS; TEMPERATURE DIFFERENTIAL; TWO DIMENSIONAL (2 D);

CRYSTAL ATOMIC STRUCTURE;

EID: 84948748512     PISSN: 21919089     EISSN: 21919097     Source Type: Journal    
DOI: 10.1515/ntrev-2014-0024     Document Type: Review

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