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Applied Physics Letters

Volumn 97, Issue 22, 2010, Pages

Measurement of the thermal conductance of the graphene/ SiO2 interface

(3) Mak, Kin Fai a Lui, Chun Hung a Heinz, Tony F a

a Och Spine at New York Presbyterian Hospitals (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE VALUES; GRAPHENE LAYERS; MECHANICAL EXFOLIATION; OPTICAL PUMPS; PICOSECOND TIME SCALE; ROOM TEMPERATURE; THERMAL CONDUCTANCE; TRANSIENT REFLECTIVITY; ULTRA-FAST;

GRAPHENE; OPTICAL PUMPING; PUMPS; THERMAL CONDUCTIVITY;

SILICON COMPOUNDS;

EID: 78650675684 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3511537 Document Type: Article

Times cited : (181)

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