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Volumn 123, Issue 1, 2001, Pages 138-144
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Photo-acoustic measurement of thermal conductivity of thin films and bulk materials
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Author keywords
Contact resistance; Heat transfer; Measurement techniques; Thermoacoustics; Thin films
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Indexed keywords
COATING TECHNIQUES;
NICKEL;
PHASE SHIFT;
PHOTOACOUSTIC EFFECT;
SILICA;
SILICON WAFERS;
SURFACE ROUGHNESS;
THERMAL CONDUCTIVITY;
BULK MATERIALS;
THERMAL BARRIER COATINGS;
THIN FILMS;
ACOUSTIC TECHNIQUE;
CONTACT RESISTANCE;
FILM;
MANUFACTURE;
THERMAL CONDUCTIVITY;
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EID: 0035244407
PISSN: 00221481
EISSN: None
Source Type: Journal
DOI: 10.1115/1.1337652 Document Type: Article |
Times cited : (90)
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References (25)
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