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Volumn 123, Issue 1, 2001, Pages 138-144

Photo-acoustic measurement of thermal conductivity of thin films and bulk materials

Author keywords

Contact resistance; Heat transfer; Measurement techniques; Thermoacoustics; Thin films

Indexed keywords

COATING TECHNIQUES; NICKEL; PHASE SHIFT; PHOTOACOUSTIC EFFECT; SILICA; SILICON WAFERS; SURFACE ROUGHNESS; THERMAL CONDUCTIVITY;

EID: 0035244407     PISSN: 00221481     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1337652     Document Type: Article
Times cited : (90)

References (25)
  • 22
    • 0028381398 scopus 로고
    • Photoacoustic characterization of thermal transport properties in thin films and microstructures
    • (1994) Thin Solid Films , vol.238 , pp. 199-206
    • Rohde, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.