메뉴 건너뛰기




Volumn 12, Issue 2, 1998, Pages 121-131

Review of the thermal conductivity of thin films

Author keywords

Charge separation reaction; Fullerene ions; Metastable decay; MIKE scan technique

Indexed keywords

DEPOSITION; HEAT CONDUCTION; MICROELECTRONICS; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL VARIABLES MEASUREMENT;

EID: 0032047475     PISSN: 08878722     EISSN: None     Source Type: Journal    
DOI: 10.2514/2.6321     Document Type: Review
Times cited : (44)

References (46)
  • 1
    • 0040151682 scopus 로고    scopus 로고
    • Heat Transport in Dielectric Thin Films and at Solid-Solid Interfaces
    • Cahill, D. G., "Heat Transport in Dielectric Thin Films and at Solid-Solid Interfaces," Microscale Thermophysical Engineering, Vol. 1, No. 1, 1997, pp. 85-109.
    • (1997) Microscale Thermophysical Engineering , vol.1 , Issue.1 , pp. 85-109
    • Cahill, D.G.1
  • 2
    • 0028403721 scopus 로고
    • Solid Layer Thermal Conductivity Measurement Techniques
    • Goodson, K. E., and Flik, M. I., "Solid Layer Thermal Conductivity Measurement Techniques," Applied Mechanics Reviews, Vol. 47, No. 3, 1994, pp. 101-112.
    • (1994) Applied Mechanics Reviews , vol.47 , Issue.3 , pp. 101-112
    • Goodson, K.E.1    Flik, M.I.2
  • 3
    • 0002600756 scopus 로고
    • Thermal Conductivity of CVD Diamond: Techniques and Results
    • Graebner, J. E., "Thermal Conductivity of CVD Diamond: Techniques and Results," Diamond Filins and Technology, Vol. 3, No. 2, 1993, pp. 77-130.
    • (1993) Diamond Filins and Technology , vol.3 , Issue.2 , pp. 77-130
    • Graebner, J.E.1
  • 5
    • 0027576198 scopus 로고
    • Thermal Conductivities of Quantum Well Structures
    • Chen, G., and Tien, C. L., "Thermal Conductivities of Quantum Well Structures," Journal of Thermophysics and Heat Transfer, Vol. 7, No. 2, 1993, pp. 311-318.
    • (1993) Journal of Thermophysics and Heat Transfer , vol.7 , Issue.2 , pp. 311-318
    • Chen, G.1    Tien, C.L.2
  • 6
    • 0000263715 scopus 로고
    • A Novel Method for Measuring the Thermal Conductivity of Submicrometrc Thick Dielectric Films
    • May
    • Okuda, M., and Ohkubo, S., "A Novel Method for Measuring the Thermal Conductivity of Submicrometrc Thick Dielectric Films," Thin Solid Films, Vol. 213, May 1992, pp. 176-181.
    • (1992) Thin Solid Films , vol.213 , pp. 176-181
    • Okuda, M.1    Ohkubo, S.2
  • 8
    • 32144460107 scopus 로고
    • Thermal Conductivity of Amorphous Solids above the Plateau
    • Cahill, D. G., and Pohl, R. O., "Thermal Conductivity of Amorphous Solids Above the Plateau," Physical Review B: Solid State, Vol. 35, No. 8, 1987, pp. 4067-4073.
    • (1987) Physical Review B: Solid State , vol.35 , Issue.8 , pp. 4067-4073
    • Cahill, D.G.1    Pohl, R.O.2
  • 9
    • 0000606184 scopus 로고
    • Thermal Resistance at Interfaces
    • Swartz, E. T., and Pohl, R. O., "Thermal Resistance at Interfaces," Applied Physics Letters, Vol. 51, No. 26, 1987, pp. 2200-2202.
    • (1987) Applied Physics Letters , vol.51 , Issue.26 , pp. 2200-2202
    • Swartz, E.T.1    Pohl, R.O.2
  • 10
    • 0001679381 scopus 로고
    • Thermal Conductivity of Sputtered Oxide Films
    • Lee, S. M., Cahill, D. G., and Allen, T. H., "Thermal Conductivity of Sputtered Oxide Films," Physical Review B: Solid State, Vol. 52, No. 1, 1995, pp. 253-257.
    • (1995) Physical Review B: Solid State , vol.52 , Issue.1 , pp. 253-257
    • Lee, S.M.1    Cahill, D.G.2    Allen, T.H.3
  • 12
    • 0001230361 scopus 로고
    • Thermal Conductivity and Localization in Glasses: Numerical Study of a Model of Amorphous Silicon
    • Feldman, J. L., Kuge, M. D., Allen, P. B., and Wooten, F., "Thermal Conductivity and Localization in Glasses: Numerical Study of a Model of Amorphous Silicon," Physical Review B: Solid State, Vol. 48, No. 17, 1993, pp. 12,589-12,595.
    • (1993) Physical Review B: Solid State , vol.48 , Issue.17
    • Feldman, J.L.1    Kuge, M.D.2    Allen, P.B.3    Wooten, F.4
  • 13
    • 84889224774 scopus 로고    scopus 로고
    • Influence of Interface Thermal Conductance on the Apparent Thermal Conductivity of Thin Films
    • Univ. of California, Santa Barbara, CA, Aug.
    • Lee, S. M., and Cahill, D. G., "Influence of Interface Thermal Conductance on the Apparent Thermal Conductivity of Thin Films," 2nd U.S./Japan Molecular and Microscale Phenomena Conf., Univ. of California, Santa Barbara, CA, Aug. 1996.
    • (1996) 2nd U.S./Japan Molecular and Microscale Phenomena Conf.
    • Lee, S.M.1    Cahill, D.G.2
  • 14
    • 0343635648 scopus 로고
    • Thermal Conductivity and Diffusivity of Free Standing Silicon Nitride Thin Films
    • Zhang, X., and Grigoropoulos, P., "Thermal Conductivity and Diffusivity of Free Standing Silicon Nitride Thin Films," Review of Scientific Instruments, Vol. 66, No. 2, 1995, pp. 1115-1120.
    • (1995) Eview of Scientific Instruments , vol.66 , Issue.2 , pp. 1115-1120
    • Zhang, X.1    Grigoropoulos, P.2
  • 15
    • 17044364634 scopus 로고
    • Experiments Using a Simple Thermal Comparator for Measurement of Thermal Conductivity, Surface Roughness, and Thickness of Foils or of Surface Deposits
    • Dec.
    • Powell, R. W., "Experiments Using a Simple Thermal Comparator for Measurement of Thermal Conductivity, Surface Roughness, and Thickness of Foils or of Surface Deposits," Journal of Scientific Instruments, Vol. 34, Dec. 1957, pp. 485-492.
    • (1957) Journal of Scientific Instruments , vol.34 , pp. 485-492
    • Powell, R.W.1
  • 16
    • 0026377624 scopus 로고
    • Thermal Conductivity of Thin Films: Measurements and Microstructural Effects
    • American Society of Mechanical Engineers, HTD, New York
    • Lambropoulos, J. C., Jacobs, S. D., Burns, S. J., Shaw-Klein, L., and Hwang, S. S., "Thermal Conductivity of Thin Films: Measurements and Microstructural Effects," Thin Film Heat Transfer: Properties and Processing, Vol. 184, American Society of Mechanical Engineers, HTD, New York, 1991, pp. 21-32.
    • (1991) Thin Film Heat Transfer: Properties and Processing , vol.184 , pp. 21-32
    • Lambropoulos, J.C.1    Jacobs, S.D.2    Burns, S.J.3    Shaw-Klein, L.4    Hwang, S.S.5
  • 17
    • 0025464802 scopus 로고
    • 4 Sandwich System
    • July
    • 4 Sandwich System," Thin Solid Films, Vol. 188, July 1990, pp. 27-33.
    • (1990) Thin Solid Films , vol.188 , pp. 27-33
    • Völklein, F.1
  • 18
    • 0002793940 scopus 로고
    • Methods for the Measurement of Thermal Conductivity and Thermal Diffusivity of Very Thin Films and Foils
    • Völklein F., and Kessler E., "Methods for the Measurement of Thermal Conductivity and Thermal Diffusivity of Very Thin Films and Foils," Measurement, Vol. 5, No. 1, 1987, pp. 38-45.
    • (1987) Measurement , vol.5 , Issue.1 , pp. 38-45
    • Völklein, F.1    Kessler, E.2
  • 19
    • 0027575865 scopus 로고
    • Thermal Conductivity of Thin Amorphous Alumina Films
    • April
    • Stark, I., Stordeur, M., and Syrowatka, F., "Thermal Conductivity of Thin Amorphous Alumina Films," Thin Solid Films, Vol. 226, April 1993, pp. 185-190.
    • (1993) Thin Solid Films , vol.226 , pp. 185-190
    • Stark, I.1    Stordeur, M.2    Syrowatka, F.3
  • 22
    • 0027680846 scopus 로고
    • Annealing Temperature Dependence of the Thermal Conductivity of LPCVD Silicon-Dioxide Layers
    • Goodson, K. E., Flik, M. I., Su, L. T., and Antoniadis, D. A., "Annealing Temperature Dependence of the Thermal Conductivity of LPCVD Silicon-Dioxide Layers," IEEE Electron Device Letters, Vol. 14, No. 10. 1993, pp. 490-492.
    • (1993) IEEE Electron Device Letters , vol.14 , Issue.10 , pp. 490-492
    • Goodson, K.E.1    Flik, M.I.2    Su, L.T.3    Antoniadis, D.A.4
  • 23
    • 0028427664 scopus 로고
    • Prediction and Measurement of Thermal Conductivity of Amorphous Dielectric Layer
    • May
    • Goodson, K. E., Flik, M. I., Su, L. T., and Antoniadis, D. A., "Prediction and Measurement of Thermal Conductivity of Amorphous Dielectric Layer," Journal of Heat Transfer, Vol. 116, May 1994, pp. 317-324.
    • (1994) Journal of Heat Transfer , vol.116 , pp. 317-324
    • Goodson, K.E.1    Flik, M.I.2    Su, L.T.3    Antoniadis, D.A.4
  • 24
    • 36449004963 scopus 로고
    • Thermal Conduction Normal to Metallized Silicon-Dioxide Layers on Silicon
    • Käding, O. W., Skurk, H., and Goodson, K. E., "Thermal Conduction Normal to Metallized Silicon-Dioxide Layers on Silicon," Applied Physics Letters, Vol. 65, No. 13, 1994, pp. 1629-1631.
    • (1994) Applied Physics Letters , vol.65 , Issue.13 , pp. 1629-1631
    • Käding, O.W.1    Skurk, H.2    Goodson, K.E.3
  • 25
    • 0001399444 scopus 로고
    • The Thermal Conductivity of Chemical Vapor Deposited Diamond Films on Silicon
    • Graebner, J. E., Mucha, J. A., Seibles, L., and Kammlott, G. W., "The Thermal Conductivity of Chemical Vapor Deposited Diamond Films on Silicon," Journal of Applied Physics, Vol. 71, No. 7, 1992, pp. 3143-3146.
    • (1992) Journal of Applied Physics , vol.71 , Issue.7 , pp. 3143-3146
    • Graebner, J.E.1    Mucha, J.A.2    Seibles, L.3    Kammlott, G.W.4
  • 28
    • 0026930867 scopus 로고
    • Large Inisotropic Thermal Conductivity in Synthetic Diamond Films
    • Oct.
    • Graebner, J. E., Jin, S., Kammlott, G. W., Herb, J. A., and Gardinier, C. F., "Large Inisotropic Thermal Conductivity in Synthetic Diamond Films," Nature, Vol. 359, Oct. 1992, pp. 401-403.
    • (1992) Nature , vol.359 , pp. 401-403
    • Graebner, J.E.1    Jin, S.2    Kammlott, G.W.3    Herb, J.A.4    Gardinier, C.F.5
  • 30
    • 0025476292 scopus 로고
    • Crystalline Perfection of Chemical Vapor Deposited Diamond Films
    • Aug.
    • Hetherington, A. V., Wort, C. J. H., and Southwort, P. J., "Crystalline Perfection of Chemical Vapor Deposited Diamond Films," Journal of Materials Research, Vol. 5, Aug. 1990, pp. 1591-1594.
    • (1990) Journal of Materials Research , vol.5 , pp. 1591-1594
    • Hetherington, A.V.1    Wort, C.J.H.2    Southwort, P.J.3
  • 31
    • 0029676410 scopus 로고    scopus 로고
    • Thermal Conduction in Non-Homogeneous CVD Diamond Layers in Electronic Microstructures
    • May
    • Goodson, K. E., "Thermal Conduction in Non-Homogeneous CVD Diamond Layers in Electronic Microstructures," Journal of Heat Transfer, Vol. 118, May 1996, pp. 279-286.
    • (1996) Journal of Heat Transfer , vol.118 , pp. 279-286
    • Goodson, K.E.1
  • 33
    • 0006709995 scopus 로고
    • The Thermal Conductivity of Rare-Earth-Transition-Metal Films as Determined by the Wiedemann-Franz Law
    • Anderson, R. J., "The Thermal Conductivity of Rare-Earth-Transition-Metal Films as Determined by the Wiedemann-Franz Law," Journal of Applied Physics, Vol. 67, No. 11, 1990, pp. 6914-6916.
    • (1990) Journal of Applied Physics , vol.67 , Issue.11 , pp. 6914-6916
    • Anderson, R.J.1
  • 35
    • 36549104450 scopus 로고    scopus 로고
    • Thermal Conductivity of Optical Coatings
    • Redondo, A., and Beery, J. G., "Thermal Conductivity of Optical Coatings," Journal of Applied Physics, Vol. 60, No. 11, 1996, pp. 3882-3885.
    • (1996) Journal of Applied Physics , vol.60 , Issue.11 , pp. 3882-3885
    • Redondo, A.1    Beery, J.G.2
  • 36
    • 0001764219 scopus 로고
    • Photoacoustic Determination of Thin-Film Properties
    • Swimm, R. T., " Photoacoustic Determination of Thin-Film Properties," Applied Physics Letters, Vol. 42, No. 11, 1983, pp. 955-957.
    • (1983) Applied Physics Letters , vol.42 , Issue.11 , pp. 955-957
    • Swimm, R.T.1
  • 39
    • 84953682805 scopus 로고
    • The Microstructure of Sputter-Deposited Coatings
    • Thornton, J. A., "The Microstructure of Sputter-Deposited Coatings," Journal of Vacuum Science and Technology, Vol. A4, No. 6, 1986, pp. 3059-3065.
    • (1986) Journal of Vacuum Science and Technology , vol.A4 , Issue.6 , pp. 3059-3065
    • Thornton, J.A.1
  • 40
    • 0000164492 scopus 로고
    • Study of the Structure and Properties of Thick Vacuum Condensates of Nickel, Tungsten, Aluminum Oxide, and Zirconium Oxide
    • Movchan, B. A., and Demchishin, A. V., "Study of the Structure and Properties of Thick Vacuum Condensates of Nickel, Tungsten, Aluminum Oxide, and Zirconium Oxide," Journal of Physics of Metals and Metallography, Vol. 28, No. 4, 1969, pp. 83-90.
    • (1969) Journal of Physics of Metals and Metallography , vol.28 , Issue.4 , pp. 83-90
    • Movchan, B.A.1    Demchishin, A.V.2
  • 41
    • 0002376980 scopus 로고
    • Structure of Evaporated Metal Films
    • edited by J. R. Anderson, Academic, New York
    • Sanders, J. V., "Structure of Evaporated Metal Films," Chemisorption and Reactions on Metal Films," edited by J. R. Anderson, Academic, New York, 1971, pp. 1-38.
    • (1971) Chemisorption and Reactions on Metal Films , pp. 1-38
    • Sanders, J.V.1
  • 42
    • 0016083153 scopus 로고
    • Influence of Apparatus Geometry and Deposition Conditions on the Structure and Topography of Thick Sputtered Coatings
    • Thornton, J. A., "Influence of Apparatus Geometry and Deposition Conditions on the Structure and Topography of Thick Sputtered Coatings," Journal of Vacuum Science and Technology, Vol. 11, No. 4, 1974, pp. 666-676.
    • (1974) Journal of Vacuum Science and Technology , vol.11 , Issue.4 , pp. 666-676
    • Thornton, J.A.1
  • 43
    • 0022277876 scopus 로고
    • Microstructure Considerations in Hydrogenated Amorphous Silicon Thin Films
    • edited by P. Hassen and R. I. Jaffee, Pergamon, New York
    • Thornton, J. A., "Microstructure Considerations in Hydrogenated Amorphous Silicon Thin Films," Amorphous Metals and Semiconductors, edited by P. Hassen and R. I. Jaffee, Pergamon, New York, 1986, pp. 299-314.
    • (1986) Amorphous Metals and Semiconductors , pp. 299-314
    • Thornton, J.A.1
  • 44
    • 0005060606 scopus 로고
    • Computer Simulation of Amorphous Thin Films of Hard Spheres
    • Nov.
    • Kim, S., Henderson, D. J., and Chaudhari, P., "Computer Simulation of Amorphous Thin Films of Hard Spheres," Thin Solid Films, Vol. 47, Nov. 1977, pp. 155-158.
    • (1977) Thin Solid Films , vol.47 , pp. 155-158
    • Kim, S.1    Henderson, D.J.2    Chaudhari, P.3
  • 45
    • 0001254055 scopus 로고
    • Dependence of Thin Film Microstructure on Deposition Rate by Means of a Computer Simulation
    • Müller, K. H., "Dependence of Thin Film Microstructure on Deposition Rate by Means of a Computer Simulation," Journal of Applied Physics, Vol. 58, No. 7, 1985, pp. 2573-2581.
    • (1985) Journal of Applied Physics , vol.58 , Issue.7 , pp. 2573-2581
    • Müller, K.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.