SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 107, Issue 3, 2015, Pages

Optimization of the imaging response of scanning microwave microscopy measurements

(7) Sardi, G M a Lucibello, A a Kasper, M b Gramse, G b Proietti, E a Kienberger, F c Marcelli, R a

a CNR (Italy)

b JOHANNES KEPLER UNIVERSITY LINZ (Austria)

c KEYSIGHT TECHNOLOGIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPLEX NETWORKS; ELECTRIC NETWORK ANALYZERS; PHASE MEASUREMENT; SEMICONDUCTOR DEVICES;

AMPLITUDE AND PHASE MEASUREMENTS; BIOLOGICAL SPECIMENS; COMPLEX REFLECTION COEFFICIENT; MAXIMUM SENSITIVITY; OPTIMAL FREQUENCY; SCANNING MICROWAVE MICROSCOPES; SCANNING MICROWAVE MICROSCOPIES; VECTOR NETWORK ANALYZERS;

MICROWAVE RESONATORS;

EID: 84937780232 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4927385 Document Type: Article

Times cited : (13)

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