Effect of tip geometry on contrast and spatial resolution of the near-field microwave microscope

Journal of Applied Physics

Volumn 100, Issue 4, 2006, Pages

  Imtiaz, Atif ^a   Anlage, Steven M ^a  

^a Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NEAR FIELD SCANNING MICROWAVE MICROSCOPY; SPATIAL RESOLUTION; TIP GEOMETRY; TUNNELING HEIGHT;

ELECTRON TUNNELING; EMBEDDED SYSTEMS; IMAGING TECHNIQUES; SCANNING ELECTRON MICROSCOPY; SIGNAL DETECTION; SURFACE TOPOGRAPHY;

MICROSCOPES;

EID: 33748353841     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2234801     Document Type: Article

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