Three-dimensional finite-element simulations of a scanning microwave microscope cantilever for imaging at the nanoscale

Applied Physics Letters

Volumn 103, Issue 21, 2013, Pages

  Oladipo, A O ^a,b   Kasper, M ^c   Lavdas, S ^b   Gramse, G ^c   Kienberger, F ^d   Panoiu, N C ^b  

^a Bio Nano Consulting Ltd   (United Kingdom)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^d Agilent Technologies Osterrreich GmbH   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION PROCEDURE; COMPLEX IMPEDANCE MEASUREMENTS; COMPUTATIONAL TECHNIQUE; ELECTROMAGNETIC INTERACTIONS; FINITE ELEMENT SIMULATIONS; INCLINATION ANGLES; SCANNING MICROWAVE MICROSCOPES; SCANNING MICROWAVE MICROSCOPIES;

CALIBRATION; THREE DIMENSIONAL;

NANOCANTILEVERS;

EID: 84888422951     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4832456     Document Type: Article

References (20)

1. E. Kymakis and G. A. J. Amaratunga, Appl. Phys. Lett. 80, 112 (2002). 10.1063/1.1428416
2. W. Zhu, C. Bower, O. Zhou, G. Kochanski, and S. Jin, Appl. Phys. Lett. 75, 873 (1999). 10.1063/1.124541
3. B. T. Rosner and D. W. van der Weide, Rev. Sci. Instrum. 73, 2505 (2002). 10.1063/1.1482150
4. A. C. Balazs, T. Emrick, and T. P. Russell, Science 314, 1107 (2006). 10.1126/science.1130557
5. H.-Y. Chen, M. K. F. Lo, G. Yang, H. G. Monbouquette, and Y. Yang, Nat. Nanotechnol. 3, 543 (2008). 10.1038/nnano.2008.206
6. M. M. van Schooneveld, A. Gloter, O. Stephan, L. F. Zagonel, R. Koole, A. Meijerink, W. J. M. Mulder, and F. M. F. de Groot, Nat. Nanotechnol. 5, 538 (2010). 10.1038/nnano.2010.105
7. P. Alivisatos, Nat. Biotechnol. 22, 47 (2004). 10.1038/nbt927
8. X. Michalet, F. F. Pinaud, L. A. Bentolila, J. M. Tsay, S. Doose, J. J. Li, G. Sundaresan, A. M. Wu, S. S. Gambhir, and S. Weiss, Science 307, 538 (2005). 10.1126/science.1104274
9. M. E. Davis, Z. Chen, and D. M. Shin, Nat. Rev. Drug Discovery 7, 771 (2008). 10.1038/nrd2614
10. D. M. Jones, J. R. Smith, W. T. S. Huck, and C. Alexander, Adv. Mater. 14, 1130 (2002). 10.1002/1521-4095(20020816)14:16<1130::AID-ADMA1130>3.0. CO;2-7
11. D. Fotiadis, S. Scheuring, S. A. Muller, A. Engel, and D. J. Muller, Micron 33, 385 (2002). 10.1016/S0968-4328(01)00026-9
12. L. Fumagalli, D. Esteban-Ferrer, A. Cuervo, J. S. Carrascosa, and G. Gomila, Nature Mater. 11, 808 (2012). 10.1038/nmat3369
13. S. Belaidi, P. Girard, and G. Leveque, J. Appl. Phys. 81, 1023 (1997). 10.1063/1.363884
14. J. W. Hong, K. H. Noh, S. Park, S. I. Kwun, and Z. G. Khim, Phys. Rev. B 58, 5078 (1998). 10.1103/PhysRevB.58.5078
15. C. Gao, T. Wei, F. Duewer, Y. L. Lu, and X. D. Xiang, Appl. Phys. Lett. 71, 1872 (1997). 10.1063/1.120444
16. M. Tabib-Azar and Y. Q. Wang, IEEE Trans. Microwave Theory Tech. 52, 971 (2004). 10.1109/TMTT.2004.823596
17. H. Tanbakuchi, M. Richter, F. Kienberger, and H. P. Huber, in IEEE International Conference on Microwave, Communication, Antennas and Electronics Systems, Tel Aviv, Israel, 2009, pp. 1-4.
18. H. P. Huber, M. Moertelmaier, T. M. Wallis, C. J. Chiang, M. Hochleitner, A. Imtiaz, Y. J. Oh, K. Schilcher, M. Dieudonne, J. Smoliner, P. Hinterdorfer, S. J. Rosner, H. Tanbakuchi, P. Kabos, and F. Kienberger, Rev. Sci. Instrum. 81, 113701 (2010). 10.1063/1.3491926
19. J. Hoffmann, M. Wollensack, M. Zeier, J. Niegemann, H. Huber, and F. Kienberger, in 12th IEEE International Conference on Nanotechnology, Birmingham, UK, 2012, pp. 1-4.
20. EMPro 3D EM Simulation Software, Agilent Technologies, Inc.