Sensitivity and resolution of evanescent microwave microscope

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 2, 2006, Pages 639-646

  Kleismit, Richard A ^a,b,c   Kazimierczuk, Marian K ^a,d,e   Kozlowski, Gregory ^b,c  

^a IEEE   (United States)

^b WRIGHT STATE UNIVERSITY   (United States)

^c Anteon Corporation   (United States)

^d Wright State University   (United States)

^e Tau Beta Pi ^*  (United States)

Author keywords

Complex permittivity; Evanescent microwave microscopy; Near field; Nondestructive evaluation; Resolution; Sensitivity; Sensor; Superconductors

Indexed keywords

COMPLEX PERMITTIVITY; EVANESCENT MICROWAVE MICROSCOPY; NEAR-FIELD; NONDESTRUCTIVE EVALUATION; RESOLUTION; SENSITIVITY;

ELECTRIC LINES; OPTICAL RESOLVING POWER; RESONATORS; SENSORS; SUPERCONDUCTING MATERIALS; TUNGSTEN;

MICROWAVE DEVICES;

EID: 33144483821     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.862668     Document Type: Article

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