Hard x-ray nanofocusing at low-emittance synchrotron radiation sources

Journal of Synchrotron Radiation

Volumn 21, Issue 5, 2014, Pages 996-1005

  Schroer, Christian G ^a,b,c   Falkenberg, Gerald ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b DESY   (Germany)

^c UNIVERSITY OF HAMBURG   (Germany)

Author keywords

diffraction limited storage ring; X ray nanofocus; X ray optics

Indexed keywords

GAUSSIAN BEAMS; NANOWIRES; RADIATION; STORAGE RINGS; SYNCHROTRON RADIATION;

BEAM PROPERTIES; BRILLIANT SYNCHROTRON RADIATION; DIFFRACTION LIMITED; NANO-FOCUS; ORDERS OF MAGNITUDE; REFRACTIVE X-RAY LENS; SOURCE PARAMETERS; SYNCHROTRON RADIATION SOURCE;

DIFFRACTION;

EID: 84937420907     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577514016269     Document Type: Article

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