High-resolution, high-throughput imaging with a multibeam scanning electron microscope

Journal of Microscopy

Volumn 259, Issue 2, 2015, Pages 114-120

  Eberle, A L ^a   Mikula, S ^b   Schalek, R ^c   Lichtman, J ^c   Knothe Tate, M L ^d   Zeidler, D ^a  

^a CARL ZEISS SMT AG   (Germany)

^b MAX PLANCK INSTITUTE FOR MEDICAL RESEARCH   (Germany)

^c HARVARD UNIVERSITY   (United States)

^d UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

High throughput imaging; Multibeam; Parallel data acquisition; Scanning electron microscopy

Indexed keywords

DATA ACQUISITION; ELECTRON-ELECTRON INTERACTIONS; ELECTRONS; THROUGHPUT;

BANDWIDTH LIMIT; ELECTRON DETECTORS; ELECTRON-ELECTRON-INTERACTIONS; HIGH RESOLUTION; HIGH-THROUGHPUT IMAGING; IMAGING SPEED; MULTIBEAMS; PARALLEL DATA ACQUISITION; SCANNING ELECTRONS; SINGLE-BEAM;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; AUTOMATION; BRAIN TISSUE; CONTRAST ENHANCEMENT; ELECTRON; ELECTRON BEAM; HUMAN; IMAGE ANALYSIS; IMAGE PROCESSING; INFORMATION PROCESSING; NEUROIMAGING; PHYSICAL PARAMETERS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SIGNAL NOISE RATIO; ANIMAL; BRAIN; DEVICES; MOUSE; PROCEDURES; ULTRASTRUCTURE;

ANIMALS; BRAIN; ELECTRONS; MICE; MICROSCOPY, ELECTRON, SCANNING; SEMICONDUCTORS;

EID: 84937251613     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12224     Document Type: Article

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