Point-spread functions for backscattered imaging in the scanning electron microscope

Journal of Applied Physics

Volumn 102, Issue 12, 2007, Pages

  Hennig, Philipp ^a,b   Denk, Winfried ^a  

^a MAX PLANCK INSTITUTE FOR MEDICAL RESEARCH   (Germany)

^b ROBINSON COLLEGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BACKSCATTERING; COMPUTER SIMULATION; IMAGING SYSTEMS; SCANNING ELECTRON MICROSCOPY; SIGNAL GENERATORS;

BACKSCATTERED IMAGING; BACKSCATTERED-ELECTRON CONTRAST; SCATTERED ELECTRONS;

OPTICAL TRANSFER FUNCTION;

EID: 37549037814     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817591     Document Type: Article

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